OXFORD Instruments have launched a hand-held X-ray fluorescent analyser with silicon drift detector said to deliver fast and accurate measurements.
The new X-MET5100 X-ray fluorescence (XRF) analyzer combines the company’s silicon drift detector (SDD) with a 45kV X-ray tube.
According to the company, it enables light-elements such as magnesium, aluminum and silicon to be measured without the need for complex vacuum pump or helium tank attachments.
The product delivers laboratory quality analysis of aluminum and titanium alloys as well as copper, nickel and steel with optimum light-element capability and sensitivity.
According to the manufacturer, it can analyse and identify metal alloys and trace element results down to ppm level in a matter of seconds.